An Expert Knowledge GPS/INS System for Mobile Mapping and GIS Applications

Naser El-Sheimy

Abstract:	During the last decade Mobile Mapping Systems (MMS) became an emerging trend in Geomatics because they allow a task-oriented implementation of mapping concepts at the measurement level. This trend towards MSS in mapping and GIS application is fueled by the demand for fast and cost-effective data acquisition system. In general, the data acquisition system contains imaging sensors and navigation sensors. Navigation sensors are used to solve for the georeferencing parameters of the imaging sensors. Although a number of different systems are used in general navigation, the rather stringent requirements in terms of accuracy and environment make the integration of an inertial navigation system (INS) with receivers of the Global Positioning System (GPS) the core of any sensor combination for an accurate MMS. To achieve consistent accuracy with an integrated GPS/INS under different operational environment, expert knowledge system and quality control is a must. Since the required accuracy can usually be achieved for good satellite coverage and signal reception, the expert knowledge system is mainly concerned with cases of poor GPS satellite geometry, signal blockage, or cycle slips, and the role of INS aiding in fixing these problems. In a commercial environment, the production cost is a significant factor to take into account. The expert knowledge system optimizes the survey methodology to increase the productivity of a MMS. This means that tasks currently done by a human expert will in time be taken over by the logging and processing software.
Published in:	Proceedings of the 2000 National Technical Meeting of The Institute of Navigation January 26 - 28, 2000 Pacific Hotel Disneyland Anaheim, CA
Pages:	816 - 824
Cite this article:	El-Sheimy, Naser, "An Expert Knowledge GPS/INS System for Mobile Mapping and GIS Applications," Proceedings of the 2000 National Technical Meeting of The Institute of Navigation, Anaheim, CA, January 2000, pp. 816-824.
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