Assessment of the Quality of Raw Measurement from Samsung SOC GNSS Chip and Analysis of Positioning Accuracy Using PPP

Bogeun Cho, Bu-Gyeom Kim, Jong Heon Kim, Changdon Kee, Sunkyoung Yu, O-Jong Kim, Jungbeom Kim

Abstract:	Recently, significant advances have been made in smartphone GNSS service, such as supporting multi-constellation, dual-frequency and carrier phase measurement. Therefore, performing precise navigation using a smartphone is actively studied. Since Samsung Electronics System LSI also developed SOC GNSS chipset in this basis, this study analyzed whether Samsung SOC GNSS chipset collects appropriate measurement for precise navigation. The quality of the chipset measurement is evaluated using a separate external antenna and positioning is performed through a commercial PPP service. As a result of the analysis, the L1 pseudorange measurement has an RMS noise level of 2.9m, and the L5 pseudorange measurement has an RMS noise level of 0.2m. As for the carrier phase measurement, both L1 and L5 has mm-level (1.4 and 1.3mm) noise levels. The L1 only PPP achieve submeter accuracy and converges to 0.4 m RMS error.
Published in:	Proceedings of the 2022 International Technical Meeting of The Institute of Navigation January 25 - 27, 2022 Hyatt Regency Long Beach Long Beach, California
Pages:	789 - 798
Cite this article:	Cho, Bogeun, Kim, Bu-Gyeom, Kim, Jong Heon, Kee, Changdon, Yu, Sunkyoung, Kim, O-Jong, Kim, Jungbeom, "Assessment of the Quality of Raw Measurement from Samsung SOC GNSS Chip and Analysis of Positioning Accuracy Using PPP," Proceedings of the 2022 International Technical Meeting of The Institute of Navigation, Long Beach, California, January 2022, pp. 789-798. https://doi.org/10.33012/2022.18181
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