NEW ION TRAP FOR FREQUENCY STANDARD APPLICATIONS

J.D. Prestage, G.J. Dick, L. Maleki

Abstract:	We have designed and built a novel linear ion trap which permite storage of a large number of ion with reduced susceptibility to the second order Doppler effect caused by the Rr conflning fields. This new trap should store about 20 times the number of ions as a conventional RF trap with no corresponding increase in second order Doppler shift from the confining feld. Other comparisons to standard RP ion trape will be made.
Published in:	Proceedings of the 20th Annual Precise Time and Time Interval Systems and Applications Meeting November 29 - 1, 1988 Sheraton Premiere Hotel Vienna, Virginia
Pages:	305 - 312
Cite this article:	Prestage, J.D., Dick, G.J., Maleki, L., "NEW ION TRAP FOR FREQUENCY STANDARD APPLICATIONS," Proceedings of the 20th Annual Precise Time and Time Interval Systems and Applications Meeting, Vienna, Virginia, November 1988, pp. 305-312.
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