ACCURACY MODEL FOR PHASE NOISE MEASUREMENTS

F. L. Walls, C.M. Felton, A.J.D Clements, T.D. Martin

Abstract: We have recently completed a new modular system for accurate measurements of phase noise in oscillators, amplifiers, frequency synthesizers, and passive components. This new system is capable of measuring the phase noise at carrier frequencies from 5 MHz to 1.5 GHz, 1.5 to 26 GHz, and 33 to 50 GHz. Other frequency ranges can be measured using external mixers to convert the signals into one of the above frequency ranges. The analysis bandwidths vary from 0.1 Hz to 10% of the carrier frequency up to a maximum of about 1 GHz. Extensive internal calibration of the system is used to correct for all gain variations with analysis frequency including phase-locked-loop and cable-loss effects. We have also included a precision noise source to calibrate the spectral density functions of the spectrum analyzers. As a part of this program we have developed a method for determining the biases in the various spectrum analyzers as a function of noise type and the confidence of the spectral density estimates. We also investigate the effect of amplitude noise and phase delays on phase noise measurements. The combination of all these features makes it possible, under favorable conditions, to measure phase noise in various signal handling components and sources to an accuracy of 1 dB over very wide analysis bandwidths. Detailed descriptions of the new calibration procedures, including a sample table of uncertainties, are given. High accuracy determinations of phase noise can be used to compute accurate values of short-term, time-domain frequency stability.
Published in: Proceedings of the 21th Annual Precise Time and Time Interval Systems and Applications Meeting
November 28 - 30, 1989
Sheraton Hotel
Redondo Beach, California
Pages: 295 - 322
Cite this article: Walls, F. L., Felton, C.M., Clements, A.J.D, Martin, T.D., "ACCURACY MODEL FOR PHASE NOISE MEASUREMENTS," Proceedings of the 21th Annual Precise Time and Time Interval Systems and Applications Meeting, Redondo Beach, California, November 1989, pp. 295-322.
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