LONG-TERM MICROWAVE POWER DRIFT OF A CESIUM FREQUENCY STANDARD AND ITS EFFECT ON OUTPUT FREQUENCY

W.A. Johnson, S.K. Karuza, F.J. Voit

Abstract: It has been shown previously that the long-term frequency stability of a cesium (Cs) frequency standard is affected by variations in the standard's internal microwave power Source (1,2). Studies were performed on a commercial Cs frequency standard for a period of 20 days, to determine the stability of its microwave power source. The results were then analyzed statistically, and the effects of microwave power drift on the standard's frequency stability were calculated.
Published in: Proceedings of the 22th Annual Precise Time and Time Interval Systems and Applications Meeting
December 4 - 6, 1990
Sheraton Premiere Hotel
Vienna, Virginia
Pages: 209 - 220
Cite this article: Johnson, W.A., Karuza, S.K., Voit, F.J., "LONG-TERM MICROWAVE POWER DRIFT OF A CESIUM FREQUENCY STANDARD AND ITS EFFECT ON OUTPUT FREQUENCY," Proceedings of the 22th Annual Precise Time and Time Interval Systems and Applications Meeting, Vienna, Virginia, December 1990, pp. 209-220.
Full Paper: ION Members/Non-Members: 1 Download Credit
Sign In