TRAPPED-ION FREQUENCY STANDARDS

D.J. Wineland, W.M. Itano, J.C. Bergquist, J.J. Bollinger, D.J. Heinzen, C.H. Manney, F. L, Moore, M. G. Raizen, C. S. Weimer

Abstract:	Frequency standards based on stored atomic ions are briefly reviewed. Specific examples are chosen to illustrate what is currently possible. Both rf microwave and optical devices are discussed. The present limitations to existing experiments and possibilities for future improvement are outlined.
Published in:	Proceedings of the 22th Annual Precise Time and Time Interval Systems and Applications Meeting December 4 - 6, 1990 Sheraton Premiere Hotel Vienna, Virginia
Pages:	53 - 60
Cite this article:	Wineland, D.J., Itano, W.M., Bergquist, J.C., Bollinger, J.J., Heinzen, D.J., Manney, C.H., L, F., Moore,, Raizen, M. G., Weimer, C. S., "TRAPPED-ION FREQUENCY STANDARDS," Proceedings of the 22th Annual Precise Time and Time Interval Systems and Applications Meeting, Vienna, Virginia, December 1990, pp. 53-60.
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