Measurement of Precision Oscillator Phase Noise Using the Two-Oscillator Coherent Down-Conversion Technique

Christopher J. Pagnanelli, William F. Cashin

Abstract:	This paper addresses the characterization of precision frequency standard phase noise and spurious outputs wing the two-oscillator coherent downconversion technique. This paper focuses on techniques for making accurate measurements of phase noise and spurious outputs within 100 KHz of a carrier. Significant sources of measurement error related to hardware design problems and inadequate measurement procedures are discussed, such as: measurement errors resulting from system noise sources, phase-locked loop effects, and system bandwidth limitations. In addition, methods and design considerations for minimizing the effects of such errors are presented. Analytic discussions and results are supplemented with actual test data and measurements made using measurement hardware developed at Ball Corporation, Efratom Division.
Published in:	Proceedings of the 23th Annual Precise Time and Time Interval Systems and Applications Meeting December 3 - 5, 1991 Pasadena, California
Pages:	189 - 207
Cite this article:	Pagnanelli, Christopher J., Cashin, William F., "Measurement of Precision Oscillator Phase Noise Using the Two-Oscillator Coherent Down-Conversion Technique," Proceedings of the 23th Annual Precise Time and Time Interval Systems and Applications Meeting, Pasadena, California, December 1991, pp. 189-207.
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