Long-Term Stability of NIST Chip-Scale Atomic Clock Physics Packages

S. Knappe, V. Shah, V. Gerginov, A. Brannon, L. Hollberg, J. Kitching

Abstract:	We present measurements regarding the long-term frequency stability of NIST chip-scale atomic clock (CSAC) physics packages. Changes of the clock frequency are caused mainly through time-dependent light shifts by the frequency-modulated VCSEL and properties of the vapor cell. We suggest advanced CPT interrogation schemes to relax the requirements on the temperature stability of the VCSEL as well as the power of the local oscillator. Finally, we discuss the advantages and limitations of these techniques when implemented into a small package.
Published in:	Proceedings of the 38th Annual Precise Time and Time Interval Systems and Applications Meeting December 7 - 9, 2006 Hyatt Regency Reston Town Center Reston, Virginia
Pages:	241 - 250
Cite this article:	Knappe, S., Shah, V., Gerginov, V., Brannon, A., Hollberg, L., Kitching, J., "Long-Term Stability of NIST Chip-Scale Atomic Clock Physics Packages," Proceedings of the 38th Annual Precise Time and Time Interval Systems and Applications Meeting, Reston, Virginia, December 2006, pp. 241-250.
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