Ionospheric Modeling by Using Self-Organizing Map (SOM) Under the Disturbed Condition
Kazue Murai, The University of Tokyo; Yuki Sato, Seigo Fujita, Yuichiro Tsukamoto, Rui Hirokawa, Mitsubishi Electric Corporation; Shinichi Nakasuka, The University of Tokyo
Peer Reviewed
Ionospheric delay is the main error source of Global Navigation Satellite Systems (GNSS), and it is important to estimate an accurate understanding of ionosphere delay conditions through Total Electron Content (TEC), especially during disturbances. It is desirable that the ionospheric modeling method is as simple, responsive as possible, robust, and highly accurate. To address this challenge, in this paper, we proposed ionospheric modeling by using a Self-Organizing Map (SOM) (Kohonen., 1982) which is one of unsupervised machine learning. SOM is a method that maps from a high-dimensional space to a low-dimensional space while preserving the topology, and this method is very suitable for modeling complex distributed data in space. Since SOM has its origins in biological algorism which has topological representation self-organizing through “competitive” and “cooperative” learning processes, even complex phenomena can be modeled with flexibility and stability. In this paper, by using this proposed system, the ionosphere was modeled with only the position (Latitude and Longitude) and STEC (Slant Total Electron Content) data which is calculated by ground receivers of the GNSS Earth Observation Network System in Japan. This new approach could be applied to highly precise satellite positioning systems such as PPP-RTK including Centimeter Level Augmentation Service (QZSS CLAS) (Cabinet Office, Government of Japan., 2022), and also considering space weather, or disaster prevention in the future. Keywords: Self-Organizing Map (SOM), Ionospheric modeling
For Attendees Call for Abstracts Registration Hotel Travel and Visas Exhibits Submit Kepler Nomination For Authors and Chairs Abstract Management Student Paper Awards Editorial Review Policies Publication Ethics Policies For Exhibitors Exhibitor Resource Center Marketing Resources Other Years Future Meetings Past Meetings